28. April 2020
- 29. April 2020
Halle, Germany
CAM Workshop 2020 / CANCELED
Fraunhofer IMWS organizes the workshop on
"Innovation in Failure Analysis and Material Diagnostics of Electronics Components"
We will inform you on our "Electron Microscopy" product range:
• EM sample preparation
• Correlative AFM/SEM/FIB analysis
• In-situ TEM
• X-Ray analysis systems
• In-situ stages for SEM and µCT
Dr.
Andreas
Bergner
Produkt Manager - Elektronenmikroskopie & Nanotechnologie
+49 6157 80710-12 | |
+49 6157 80710912 | |
E-Mail schreiben |
Dr.
Andreas
Bergner