31. August 2022  - 02. September 2022 DESY Hamburg, Germany

5th EuFN Workshop

European FIB Network

We will present our Correlative AFM and SEM system:

The AFSEM system from GETec enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market and can easily be added to your system.

Meet our colleagues:
Dr. Chris Schwalb
Dr. Chris Schwalb
Event website EuFN Workshop


Quantum Design GmbH

Im Tiefen See 58
64293 Darmstadt

Phone:+49 6151 8806-0
Fax:+49 6151 8806920