We will present the following products:
In situ sample management for TEM: Our principle DENSsolutions offers a complete suite of in situ sample management solutions for heating, biasind, gases & liquids in Transmission Electron Microscopes (TEM). All systems allow investigations of samples such that the dynamics can be directly observed at high resolution.
Tabletop- and Compact-Scanning Electron Microscopes: Our principle HITACHI Electron Microscopes offers high-performance, cutting-edge scanning electron microscopy with a small footprint in desktop or compact format and with intuitive, easy-to-use operation.
Particle size analyzer: Our principle CPS offers a high resolution particle sizer, measuring the size of particles in the range of 5 nm to 70 µm. The system offers highest resolution, high accuracy and repeatability as well as a wide dynamic range.
Particle Classification, optical parameters, absolute particle size distribution and numerical concentration of single particles in monodisperse or polydisperse samples is determined by CLASSIZER™ ONE, the cutting-edge particle analysis platform based on patented Single Particle Extinction and Scattering (SPES) method manufactured by EOS Italy.
Sputter coaters and carbon evaporators: Quorum Technologies is offering a wide range of different sputter coaters and carbon evaporation systems for routine as well as for very dedicated or high quality coating applications.
Correlative AFM and SEM system: The AFSEM system from GETec enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market and can easily e added to your system.