06. May 2025
- 09. May 2025
Stuttgart, Germany
Control 2025
International trade fair for quality assurance
Our colleagues will will give you an insight into our wide range of high-tech instrumentation for electron microscopy:
- EM sample preparation
- Correlative AFM/SEM/FIB analysis
- In-situ TEM
- X-ray analysis systems
- In-situ stages for SEM
- X-ray sources and windows
Dr.
Dominic
Vogt
Product Manager - Electron microscopy
| +49 6157 80710-557 | |
| +49 6157 807109557 | |
| Write e-mail |
Dr.
Dominic
Vogt
Anne
Kast
Product Manager - Electron microscopy
| +49 6157 80710-456 | |
| +49 6157 807109456 | |
| Write e-mail |
Anne
Kast
Dr.
Simon
John
