25. April 2023  - 26. April 2023 Leibniz IAMO in Halle, Germany

CAM Workshop 2023

Innovation in Failure Analysis and Material Diagnostics of Electronics Components

Dr. Andreas Bergner will present the following systems:

  • Correlative SEM-AFM analysis with the AFSEM from QD Microscopy
  • Breakthrough x-ray analysis systems from Sigray (XRF, XAS, XRM,...)
  • In-situ microscopy solutions (force, temperature, liquid,.....) from Deben and DENSSolutions
  • Sputter & carbon coaters from Quorum

Meet us at booth 13!

Event website CAM Workshop 2023

Contact

Quantum Design

Roca i Roca, 45
08226 Terrassa (Barcelona)
Spain

Phone:+34 937 349168
Fax:+34 937 349168
E-mail:iberiaqd-europe.com