Atomic force microscopes for research

Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a ... more 

Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can be investigated by analyzing tip-sample interaction forces. We offer AFMs suitable for research in materials science, polymers, electrochemistry, and other applications in nano-science and engineering.

Contact

Quantum Design S.A.R.L.

Immeuble Les Conquérants
Bâtiment Mac Kinley
1 avenue de l’Atlantique
91940 Les Ulis
France

Phone:+33 1 69194949
Fax:+33 1 69194930
E-mail:france@qd-europe.com