28. June 2020
- 01. July 2020
Ghent, Belgium
ALD/ALE2020
20th International Conference on Atomic Layer DepositionQuantum Design together with J.A. Woollam Co., Inc. we present our in-situ spectroscopic ellipsometers to be used with ALD/ALE chambers for real time monitoring of layer growth and etching.
You will find us at booth 305.
Rencontrez nos collègues:
Site de l'événement
ALD/ALE
Product Manager - Ellipsometry & Surface Science
| +49 6151 8806-68 | |
| +49 6151 8806968 | |
| wagner@qd-europe.com |
Thomas
Wagner