Microscope AFM en Stand-Alone (SA-AFM)
AFM pour grands échantillonsLe SA-AFM est un AFM en « stand-alone » adaptable à votre contrôle et recherches en permettant de scanner toutes les tailles et formes d'échantillons. Il s’agit d’un système AFM complet pour les échantillons des sciences de la vie, les grands échantillons, les mesures de routine en contrôle et la recherche en nanotechnologie. Le SA-AFM peut aussi s'intégrer aux microscopes inversés.
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Use the SA-AFM System for scanning life science samples, large samples, routine scanning of technical samples, or for nanotechnology research. The SA-AFM is affordable and complete Atomic Force Microscopy system and includes everything required for scanning all sizes and shapes of samples. It is easily integrated nanoscience instrument with all manufacturer’s inverted microscopes.
Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.
Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.
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Quantum Design S.A.R.L.
1 avenue de l’Atlantique
Bâtiment Mac Kinley
91940 Les Ulis
France
| Tél. : | 01 69 19 49 49 |
| Email : | franceqd-europe.com |
