Microscopie corrélative

Microscopie corrélative - Imagerie corrélative AFM/MEB
Imagerie corrélative AFM/MEB

The AFSEM system enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market ...


Microscopie corrélative - Chemical and nanoscale imaging system
Chemical and nanoscale imaging system

The well-established Raman-atomic force microscope (AFM) combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument ...


Microscopie corrélative - Raman, AFM and SNOM all-in-one system
Raman, AFM and SNOM all-in-one system

The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging ...


Microscopie corrélative - Combined Raman and scanning nearfield optical microscopy (SNOM) system
Combined Raman and scanning nearfield optical microscopy (SNOM) system

For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with scanning near-field optical microscopy (SNOM) for optical imaging with ...

Contact

Quantum Design S.A.R.L.

Immeuble Les Conquérants
Bâtiment Mac Kinley
1 avenue de l’Atlantique
91940 Les Ulis
France

Téléphone:+33 1 69194949
Fax:+33 1 69194930
E-mail:france@qd-europe.com
Cookie notice Cookies help us in providing our services. By using our services, you agree to the use of cookies. Privacy policy