Our supplier Advacam/Advascope presents two high-performance detectors for electron microscopy (SEM & TEM): the ePix and the ePix EFE. The detectors can be configured for almost all common applications. These include:
2D/4D STEM in SEM/TEM

• EBSD
• EELS
• Ptychography
• µED
• µCT and nanoCT

The ePix detectors are based on the third generation of Timepix technology. Advacam is a founding member of the CERN Medipix Consortium and the only company to hold a license for every generation of Timepix.
ePix detectors use data-driven readout, whereby each electron is assigned a time stamp with precise position and energy information. The detectors offer a virtually unlimited dynamic range and sensitivity that is orders of magnitude better at low keV values compared to indirect electron detection. ePix combines a powerful readout architecture with an innovative and robust detector design to create the ultimate detector for high-throughput, high-resolution, and high-sensitivity electron microscopy applications. Key advantages include:

• Single electron sensitivity
• Large solid angle in a small space
• High spatial resolution
• Ultra-fast readout speed

The detectors can be quickly and easily integrated into existing SEM or TEM systems and integrated and read out via an open SDK into existing software solutions. A standalone software solution is also available.
The energy range of the detector is 2.5-300 keV and the pixel size is 55 µm x 55 µm. With a pixel matrix of 256 x 256, this results in a sensor size of 14 mm x 14 mm. The thickness of the Si sensor can be varied in the range of 100-500 µm depending on the desired application. Each detector is developed in close consultation with our customers to achieve the best possible result.

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