Automated atomic force microscope for industryNaniteAFM from Nanosurf
The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures. Simple handling and a multitude of integration possibilities bring your product analyses to a whole new level. Check coatings for intended structures or irregularities, or use additional AFM measurement modes to detect features not visible in topography alone. Its ease of use and reproducibility make the NaniteAFM the perfect quality control tool for precision engineering, production process optimization, or semiconductor fabrication — just to name a few.Features
- High resolution digital camera (simultaneous top and side view)
- Automated measurements
Systems tailored to your needs In addition to our standard products for research, industry, and nanoeducation, we now offer a unique service that fits right in with our philosophy of being a dedicated, full-range AFM solution provider: designing and developing custom-built AFM systems, stages, and parts. A dedicated team of engineers is ready to discuss your specific application, and to design and produce the optimal solution for you: a system tailored to your exact needs and specifications.
2.40 MBCustomized AFM systems brochure
2.87 MBNaniteAFM brochure
Automated surface inspection
Production process optimization
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