Focused Ion Beam Systems (FIB/FIB-SEM)

FIB-SEM systems are used as machine tools that allow the modification and the processing of samples on a micro and nano-scale. They have become an indispensable tool for characterization and ... more 

FIB-SEM systems are used as machine tools that allow the modification and the processing of samples on a micro and nano-scale. They have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials.

Focused Ion Beam Systems (FIB/FIB-SEM) - MI4050 - Focused Ion Beam System
MI4050 - Focused Ion Beam System

The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging ...


Focused Ion Beam Systems (FIB/FIB-SEM) - NX2000 - Focused Ion and Electron Beam System & Triple Beam System
NX2000 - Focused Ion and Electron Beam System & Triple Beam System

Toward the ultimate TEM sample preparation system. FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale ...


Focused Ion Beam Systems (FIB/FIB-SEM) - NX9000 - Real-time 3D analytical FIB-SEM
NX9000 - Real-time 3D analytical FIB-SEM

The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for ...


Focused Ion Beam Systems (FIB/FIB-SEM) - Ethos NX5000 - Focused Ion and Electron Beam System
Ethos NX5000 - Focused Ion and Electron Beam System

The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for ...


Focused Ion Beam Systems (FIB/FIB-SEM) - Micro-sampling System
Micro-sampling System

This device is used for preparing the desired wafer part for analysis with STEM, TEM, etc. by extracting a micro sample with an ion beam in the vacuum chamber of an FIB system.

Contact

Quantum Design s.r.l.

Via Francesco Sapori, 27
00143 Roma
Italy

Phone:+39 06 5004204
Fax:+39 06 5010389
E-mail:italy@qd-europe.com