Focused Ion Beam Systems (FIB/FIB-SEM)
FIB-SEM systems are used as machine tools that allow the modification and the processing of samples on a micro and nano-scale. They have become an indispensable tool for characterization and ... more
FIB-SEM systems are used as machine tools that allow the modification and the processing of samples on a micro and nano-scale. They have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials.
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The MI4050 High-Performance Focused Ion Beam System is equipped with new optics and provides the world-leading SIM imaging resolution and high-definition TEM sample preparation with improved imaging ...
Toward the ultimate TEM sample preparation system. FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale ...
The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for ...
The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for ...
This device is used for preparing the desired wafer part for analysis with STEM, TEM, etc. by extracting a micro sample with an ion beam in the vacuum chamber of an FIB system.