SEM/FE-SEM/Nano-probing

We distribute a wide range of Hitachi SEMs, from the conventional ones that use a thermoionic electron source to the high-performance field emission (FE-SEM) models, passing through the tabletop ... more 

We distribute a wide range of Hitachi SEMs, from the conventional ones that use a thermoionic electron source to the high-performance field emission (FE-SEM) models, passing through the tabletop SEMs, portable, easy-to-use and designed for an immediate experience in the micrometric world. We also offer Nano-probing systems, special SEMs dedicated to EBAC analysis.

SEM/FE-SEM/Nano-probing - Tabletop SEM TM4000 series
Tabletop SEM TM4000 series

The scanning electron microscope series TM4000 reveals ease to use, small footprint and low requirements to the environment. For image acquisition users can use a 4-quadrant backscattered electron ...


SEM/FE-SEM/Nano-probing - Compact scanning electron microscope FlexSEM 1000
Compact scanning electron microscope FlexSEM 1000

The  compact SEM FlexSEM 1000 offers complete SEM analysis under variable pressure conditions with a small footprint. The instrument is equipped with a pre-centered tungsten filament, easy to maintain ...


SEM/FE-SEM/Nano-probing - SU3500
SU3500

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems to provide unparalleled imaging and analytical performance. Hitachi’s “Hex-Bias” technology ...


SEM/FE-SEM/Nano-probing - SU3800/SU3900
SU3800/SU3900

Performance & Power in a Flexible Platform. Hitachi High-Technologies‘ scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many ...


SEM/FE-SEM/Nano-probing - FE-SEM - Field Emission Scanning Electron Microscopes
FE-SEM - Field Emission Scanning Electron Microscopes

With the adoption of high brightness field emission (FE) electron source, FE-SEM can more highly focus electron beam than conventional SEM employing thermionic electron source, and hence can obtain ...


SEM/FE-SEM/Nano-probing - Nano-probing Systems
Nano-probing Systems

Nano-probing systems are SEM-based probing systems optimized for electrical characterization and Electron Beam Absorbed Current (EBAC) analysis of semiconductor devices. High resolution SEM with ...

Contact

Quantum Design s.r.l.

Via Francesco Sapori, 27
00143 Roma
Italy

Phone:+39 06 5004204
Fax:+39 06 5010389
E-mail:italy@qd-europe.com