TEM (Transmission Electron Microscopes)

from Hitachi High Technologies

There are several TEM/STEMs of different accelerating voltages and proper model is used based on the sample composition. 300 kV/200 kV models with superior resolution and penetrating power are ... more 

There are several TEM/STEMs of different accelerating voltages and proper model is used based on the sample composition. 300 kV/200 kV models with superior resolution and penetrating power are used for inorganic materials such as metals and ceramics while 120 kV model with higher contrast is used for polymers and biological tissues. When advanced analytical performances such as nano area analysis and atomic-resolution analysis are required, FE electron source and spherical aberration corrector are powerful options.

  • 0.078 nm spatial resolution for the highest performance aberration-corrected TEM/STEM models;

  • Simultaneous secondary electron imaging and STEM imaging reveal surface and bulk structures at the same time;

  • Unique analytical capabilities with the newly introduced spatially resolved EELS and the high-sensitivity EDS detectors.

TEM (Transmission Electron Microscopes) - Transmission Electron Microscope HT7800 Series
Transmission Electron Microscope HT7800 Series

The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens for high ...


TEM (Transmission Electron Microscopes) - Transmission Electron Microscope H-9500
Transmission Electron Microscope H-9500

The H-9500 is a 100-300 kV TEM with an LaB6 electron gun. This is a user-friendly workhorse for atomic-resolution TEM imaging and routine structural characterization. The excellent imaging capability ...


TEM (Transmission Electron Microscopes) - Field Emission Transmission Electron Microscope HF-3300
Field Emission Transmission Electron Microscope HF-3300

The HF-3300 is a 100-300 kV TEM/STEM/SEM powered by Hitachi's state-of-the-art cold field emission technology for high-brightness and high-energy resolution. Capabilities needed for daily material ...


TEM (Transmission Electron Microscopes) - STEM/SEM HD-2700 available with a Spherical Aberration Corrector
STEM/SEM HD-2700 available with a Spherical Aberration Corrector

The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged ...


TEM (Transmission Electron Microscopes) - Field Emission Transmission Electron Microscope HF5000
Field Emission Transmission Electron Microscope HF5000

Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance. 0.078 nm spatial resolution in STEM is achieved together with high ...

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