TEM (Transmission Electron Microscopes)
There are several TEM/STEMs of different accelerating voltages and proper model is used based on the sample composition. 300 kV/200 kV models with superior resolution and penetrating power are ... more
There are several TEM/STEMs of different accelerating voltages and proper model is used based on the sample composition. 300 kV/200 kV models with superior resolution and penetrating power are used for inorganic materials such as metals and ceramics while 120 kV model with higher contrast is used for polymers and biological tissues. When advanced analytical performances such as nano area analysis and atomic-resolution analysis are required, FE electron source and spherical aberration corrector are powerful options.
0.078 nm spatial resolution for the highest performance aberration-corrected TEM/STEM models;
Simultaneous secondary electron imaging and STEM imaging reveal surface and bulk structures at the same time;
Unique analytical capabilities with the newly introduced spatially resolved EELS and the high-sensitivity EDS detectors.
The HF-3300 is a 100-300 kV TEM/STEM/SEM powered by Hitachi's state-of-the-art cold field emission technology for high-brightness and high-energy resolution. Capabilities needed for daily material ...
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged ...
Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance. 0.078 nm spatial resolution in STEM is achieved together with high ...