28. giugno 2020
- 01. luglio 2020
Ghent, Belgium
ALD/ALE2020 / Virtual Meeting
20th International Conference on Atomic Layer DepositionQuantum Design together with J.A. Woollam Co., Inc. we present our in-situ spectroscopic ellipsometers to be used with ALD/ALE chambers for real time monitoring of layer growth and etching.
Thomas
Wagner
Product Manager - Ellipsometry & Surface Science
| +49 6157 80710-68 | |
| +49 6157 80710968 | |
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Thomas
Wagner
