Webinar: Customized and standard AFM solutions for large samples

AFM-based techniques become more and more important for research but also for quality and process control.
In contrast to many basic research applications, samples in quality and process control are often large and heavy or pose other requirements that are often not met by standard AFM systems.
This webinar will address the Alphacen 300, Nanosurf’s standard system for large and heavy samples as well as the Nanosurf’s capabilities of building custom AFM solutions for demanding samples and applications beyond pure topographic imaging.

Speaker: Dr. Christian Bippes - Application and service scientist at Nanosurf

Date: Tuesday, July 14th - h. 16:00 - 17:00 CEST

Note: A link to the recording of this presentation will be provided to all registrants, even if they are unable to attend at the time of broadcast.

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