Tabletop- and Compact-Scanning Electron Microscopes
- Magnetismo
- Scienza dei materiali
- Spettroscopia
- Imaging
- Microscopia elettronica
- AFSEM - microscopia correlativa: AFM e SEM
- Catodoluminescenza e Microscopia Correlativa
- Focused Ion Beam Systems (FIB/FIB-SEM)
- In situ TEM solutions
- SEM/FE-SEM/Nano-probing
- Sistema combinato per Imaging Raman e Microscopia Elettronica a Scansione (Raman-SEM)
- Strumentazione per la preparativa del campione
- TEM (Microscopi Elettronici a Trasmissione)
- Criogenia
- Ottica
- Luce & laser
- Life science
- Didattica
- Prodotti per l'industria
HITACHI Electron Microscopes offer high-performance, cutting-edge scanning electron microscopy with a small footprint in desktop or compact format and with intuitive, easy-to-use operation. ... più
HITACHI Electron Microscopes offer high-performance, cutting-edge scanning electron microscopy with a small footprint in desktop or compact format and with intuitive, easy-to-use operation. Equipped with a Tungsten filament, backscattered electron detector (BSE) and Secondary Electron detector (SE), variable pressure (ChargeUp Reduction) as well as a motorized stage, the instrument enables almost complete SEM analysis. The instruments are nearly maintenance free and can be upgraded with EDX systems (Energy Dispersive X-Ray Spectroscopy) from Bruker (Quantax75), Oxford (AZtecOne, LiveOne or Energy Miniscope Edition) and EDAX (Elements).
meno
The scanning electron microscope series TM4000 reveals ease to use, small footprint and low requirements to the environment. For image acquisition users can use a 4-quadrant backscattered electron ...
The compact SEM FlexSEM 1000 offers complete SEM analysis under variable pressure conditions with a small footprint. The instrument is equipped with a pre-centered tungsten filament, easy to maintain ...