Ellipsometer for texture Si solar cells T-Solar
Our partnerWoollam

Ellipsometer for texture Si solar cells T-Solar

From Woollam for textured Si solar cells

T-Solar, a special intensity optimized M-2000, addresses the measurement requirements on textures Si wafer surfaces.

Features
  • SiN thickness of texture Si wafers
  • Rotating compensator ellipsometer
  • High intensity

Further information

The T-Solar ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples. Based on the established

M-2000 rotating compensator spectroscopic ellipsometer, the T-Solar measures hundreds of wavelength across the UV-Visible-NIR. To improve performance on rough, textured surfaces that significantly reduce reflected signal, the T-Solar combines a special high-intensity lamp source with our new Intensity-Optimizer*. The T-Solar is perfect for characterizing AR coatings on etched silicon surfaces. In addition, the T-Solar features an adjustable tilt-rotation-stage*, which is required to align the pyramid structures of alkaline-etched monocrystalline surfaces.

*patent pending

Specification

  • Spectral range 245 to 1000 nm (470 wavelengths)
  • Automated filter wheel to optimize signal on any sample
  • Custom sample stage with variable tilt (0-58°) and rotation (100° range) to allow optimized measurements of textured monocrystaline silicon "pyramid" sufaces
  • Detachable focusing probes

Applications

Textured substrate The T-Solar system was specifically designed to measure AR coatings on textured substrates. Both the texturing and AR coating work to suppress reflection from the surface - making optical characterization challenging. The texturing produced from alkaline etch of monocrystalline silicon has a regular pattern of pyramids that etch along specified directions of the silicon crystal. To measure this regular pattern of pyramids requires the special T-Solar measurement geometry. With the T-Solar, the sample stage can be tilted (and rotated) from the standard geometry to align the pyramids with the probe beam used for measurement.
Silicon solar cell
Monocrystalline silicon

Downloads

Spectroscopic ellipsometers product overview
Spectroscopic ellipsometers product overview
T-Solar brochure
T-Solar brochure
Photovoltaics Application Note
Photovoltaics Application Note

Contact

Stephane Struyve
Stephane Struyve

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Contact

Quantum Design GmbH

Meerstraat 177
B-1852 Grimbergen
Belgium

Phone+32 230 84324
Mobil:+32 495 797175
E-mail:benelux@qd-europe.com
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Stephane StruyveSales Manager
+32 2 3084324
stephane.struyve@qd-europe.com