FP profiler for large format samples
- Magnetism
- Materials science
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Hall effect
- Interferometer systems
- Nanoindenters - Nanohardness tester
- Optical surface profilers
- Particle size analyzer
- Photo lithography systems
- QCM-D Quartz Crystal Microbalance
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Very-low resistance measurements
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
The FP Profiler for large samples
The contact profilers of the FP series by Toho Technology are used in both research and production for the metrological surface characterization of large format samples whenever small profilers reach ...