Spectral range: 380 nm to 900 nm (180 wavelengths)
Angle of incidence: 65°, 70° and 75°, as well as straight-through
Computer connection: USB (1.1 or higher) Automated sample height adjustment
Data acquisition time:
- 3 sec. (Fast mode)
- 10 sec. (Standard mode)
- 30 sec. (Long mode)
- liquid cell
- adapter for QCM-D
- transmission holder
- translation stage
Optical constants and thickness, anisotropy, index gradient, composition
The Alpha-SE is a very accurate and easy-to-use system to determine optical constants, thickness, index gradient, composition, etc.
With fast measurement speed and push-button operation, the Alpha-SE is ideal for qualifying thin films. Single-layer dielectrics on silicon or glass substrates can be measured in seconds. Log results for easy-to-use comparisons in both graphical and tabular formats.
Phase information of a spectroscopic ellipsometry measurement is highly sensitive to very thin films (<10 nm). Self-assembled monolayers can be assessed and quickly compared using the Alpha-SE.
Coating on glass
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