Flexus thin film stress measurement systems
- Magnetism
- Materials science
- 3D Confocal Raman microscopes
- Atomic force microscopes (AFM)
- Correlative Microscopy – Raman/AFM/SNOM/SEM
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Interferometer systems
- Optical surface profilers
- Particle size analyzer
- Photo lithography systems
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Thermoelectric measurements
- Very-low resistance measurements
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
FLX Flexus thin film stress measurement systems
Toho FLX thin film stress measurement systems allow the determination of stresses and the linear expansion coefficient of thin and thick films on silicon wafers and other substrate materials. The ...