Interferometer systems
- Magnetism
- Materials science
- 3D Confocal Raman microscopes
- Atomic force microscopes (AFM)
- Correlative Microscopy – Raman/AFM/SNOM/SEM
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Interferometer systems
- Optical surface profilers
- Particle size analyzer
- Photo lithography systems
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Thermoelectric measurements
- Very-low resistance measurements
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
Zygo's Verifire series of laser Fizeau interferometers represent a complete line of high performance metrology instruments for the measurement of plano, spherical and aspherical surfaces and ... more
Zygo's Verifire series of laser Fizeau interferometers represent a complete line of high performance metrology instruments for the measurement of plano, spherical and aspherical surfaces and material characteristics. The systems provide a variety of proprietary acquisition techniques to ensure optimum metrology in a wide range of environments.
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The new Zygo DynaFiz dynamic laser interferometer is a highly optimized optical instrument designed specifically for performing accurate metrology of optics in the presence of air turbulence and ...
Verifire XPZ - mechanical phase modulation, 640 x 480 pixel digital camera. Option 1k camera.
Verifire MST - wavelength shifting laser for simultaneous measurement of the front and back surface of transparent optics, thickness variation, wedge and 2-step homogeneity.The Verifire MST can ...
The Verifire Asphere is based on two of Zygo's core competencies, the patented multi-zoned metrology method provides a high resolution aspheric surface measurement. With multiple axes of motorized ...