28. April 2020  - 29. April 2020 Halle, Germany

CAM Workshop 2020 / CANCELED

Fraunhofer IMWS organizes the workshop on
"Innovation in Failure Analysis and Material Diagnostics of Electronics Components"

We will inform you on our "Electron Microscopy" product range:

• EM sample preparation

• Correlative AFM/SEM/FIB analysis

• In-situ TEM

• X-Ray analysis systems

• In-situ stages for SEM and µCT

Dr. Andreas Bergner
Dr. Andreas Bergner
Event website CAM Workshop

Contact

Quantum Design

Krivoklatska 37
199 00 Praha 9
Czech Republic

Phone:+420 607 014 278
E-mail:czechiaqd-europe.com