Alpha 2.0 - New developed spectroscopic ellipsometer for routine measurement

The alpha 2.0, a new developed spectroscopic ellipsometer to replace the previous, very successful system Alpha-SE, is a budget-friendly option for routine measurements of thin film thickness and refractive index. A compact footprint and simple design make the alpha 2.0 easy to use while harnessing the power of spectroscopic ellipsometry. It was designed for ease-of-use: simply place the sample on the stage, choose the model that matches your film, click “measure”, and you will have results within seconds.

Based on dual rotating element technology – rotating compensator and rotating analyzer – high precision measurements including Mueller Matrix are guaranteed.