Our partner Sigray

TriLambda Nano-XRM – 40 nm high resolution x-ray microscope


Tri Lambda ™-40 3D nano x-ray microscope is the highest resolution (40 nm) laboratory x-ray microscope in the world, with the power to image internal nanostructure and optimized performance in a wide range of samples, spanning everything from cells and polymers to geological samples and metals.

Further information

The TriLambda40™ system was developed to help research groups performing XRM experiments primarily at synchrotron setups who are limited by beamtime and who needed ultra-high resolution. The TriLambda40™ advantages at a glance are:

  • Highest resolution 3D XRM, with 40 nanometer spatial resolution
  • Patent-pending x-ray source with multiple x-ray source target materials for unique advantages including dual energy imaging and optimization of acquisition speed
  • Optimized throughput for time-based (4D) & in-situ studies
  • Designed by the world’s foremost experts on x-ray microscopes

Sigray has developed an ultrahigh brightness x-ray source featuring an x-ray target comprised of multiple materials in close thermal contact with a diamond substrate. Software selection of the target material enables rapid switching between different characteristic x-ray energies of each material, for example:

  • 8 keV (for metallic and semicon samples)
  • 6,4 keV (for ceramics)
  • 5,4 keV (for rock samples, stained cells and bones)
  • 2,7 keV (for unstained cells)




High resolution mode


40 nm


13 nm

Field of view

18 μm

Sample size

15 - 25 μm preferred

Large field of view mode


120 nm


40 nm

Field of view

60 μm

Sample size

60 - 100 μm preferred

Contrast mode

Absorption and phase contrast


Sigray high brightness microfocus source


Target material

Dual energy (standard):

Cr (5.4 keV) and Cu (8.0 keV) Additional targets include:

Fe (6.4 keV), Au (9.7 keV),

others available on request


100 W

X-ray optics


2 sets of Sigray twin paraboloidal x-ray optics matched to zone plates

Focusing objective

Fresnel diffraction zone plate lens system

Phase ring

Zernike phase shift ring

X-ray detectors

High efficiency x-ray detector sys- tem, CCD 2048 x 2048 pixel

Footprint [L x W x H]

2.3 x 1.3 x 1.5 m, 2000 kg

Maximum load

1 kg


High precision tomography stage with 12 x 10 x 12 mm travel XYZ


Synchrotron Beamline Capabilities


Ales Jandik
Ales Jandik


Quantum Design

Krivoklatska 37
199 00 Praha 9
Czech Republic

Phone:+420 607 014 278
Ales JandikSales Manager
+420 607 014292