Flexus thin film stress measurement systems
- Magnetism
- Materials science
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Hall effect
- Interferometer systems
- Nanoindenters - Nanohardness tester
- Optical surface profilers
- Particle size analyzer
- Photo lithography systems
- QCM-D Quartz Crystal Microbalance
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
FLX Flexus thin film stress measurement systems
Toho FLX thin film stress measurement systems allow the determination of stresses and the linear expansion coefficient of thin and thick films on silicon wafers and other substrate materials. The ...