QCM-D Quartz Crystal Microbalance
- Magnetism
- Materials science
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Hall effect
- Interferometer systems
- Nanoindenters - Nanohardness tester
- Optical surface profilers
- Particle size analyzer
- Photo lithography systems
- QCM-D Quartz Crystal Microbalance
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
QSense instruments - tracking changes at the surface - are based on the patented QCM-D technique. The instruments measure in real-time the mass of molecular layers that form on the quartz sensor. ... more
QSense instruments - tracking changes at the surface - are based on the patented QCM-D technique. The instruments measure in real-time the mass of molecular layers that form on the quartz sensor. Simultaneously structural (viscoelastic) properties of such molecular layers are monitored, which enables distinction between two similar interactions or observation of a phase transition in bound layers.
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QCM-D accessories and consumables
For the E-series instruments from QSense there are several modules to combine QCM-D with other techniques such as electrochemistry, ellipsometry and microscopy. Additionally 40 different sensor ...