Our partner IXRF Systems

SEM/EDS: advanced energy dispersive X-ray spectrometer system

from IXRF Systems

IXRF has been developing correlative electron microscopy solutions for more than 30 years.

In particular, it is able to offer complete and high-performance SEM EDS systems. IXRF's EDS are based on state-of-the-art SDD detectors, with active areas up to 100mm2 and fully customizable windows even for the detection of light elements thanks to the use of thin polymer layers.

As a corollary to extremely high-performance devices, IXRF's systems enjoy the most advanced yet simple management software to date: IRIDIUM ULTRA, with more than 60 analysis tools already included.

In addition, thanks to IXRF's compatibility with all major existing EDS brands, you can upgrade your old electronics, without the need to purchase a new detector, to take full advantage of the power of the latest operating systems and IRIDIUM ULTRA.

Features
  • Systems based on vibration-free SDD technology
  • Detectors also available for benchtop SEM
  • Wide selection for windows materials, even for light elements
  • Active areas up to 100mm^2
  • Energy resolution of less than 120eV
  • Electronics compatible with all EDS manufacturer brands
  • Free and easy-to-use software with more than 60 analysis tools included
  • X-Ray Fluorescence ready software
  • Routine analyses such as: asbestos and GSR analysis

Further information

For more than 30 years, IXRF has focused on the research and development of advanced X-ray detection systems. From the first system installed at Los Alamos National Laboratories in 1993, IXRF has continued to produce EDS detectors while refining their technical aspects to meet the ever-increasing needs of customers worldwide.

IXRF's EDSs are customizable to different applications.
All based on Silicon Drift Detector (SSD) technology, cooled by Peltier effect LN2 free), they can be marketed with windows composed of different materials (even for light elements) and with active area sizes up to 100mm2.

Click here to read the article: "Development of the Silicon Drift Detector for Electron Microscopy Applications"

The IRIDIUM ULTRA software will then give you access to a unique set of analysis tools, all included right out of the box. You will be able to handle routine analyses automatically, such as searching for and counting asbestos particles/fibers, you will have tools for forensic science (Gun Shot Residue, GSR and ASTM E2926), you will be able to work on large areas thanks to the stitching algorithms and then produce complete and comprehensive reports thanks to the reporting tools, and much more.

Finally, the 550i control electronics not only handle all the solutions offered by IXRF, it is also compatible with all EDS manufacturer brands, which means that you can upgrade the electronics of your old EDS system without the need to replace the detector, allowing you to work with the latest operating systems and save a considerable amount of money.

Applications

Chemical microanalysis
Asbestos analysis
Semiconductors
Solar cells
Geology
Materials science
Pharmaceutical science
Life science
Failure analysis
Forensic science (Gun Shot Residue, ASTM E2926)

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Contact

Quantum Design s.r.l.

Italy and Israel branch office
Via Francesco Sapori, 27
00143 Roma
Italy

Phone:+39 06 5004204
Fax:+39 06 5010389
E-mail:italy@qd-europe.com