CAM Workshop 2020 / CANCELED

Fraunhofer IMWS organizes the workshop on
"Innovation in Failure Analysis and Material Diagnostics of Electronics Components"

We will inform you on our "Electron Microscopy" product range:

• EM sample preparation

• Correlative AFM/SEM/FIB analysis

• In-situ TEM

• X-Ray analysis systems

• In-situ stages for SEM and µCT