AFSEM at the Weizmann Institute: two studies showcasing correlative imaging
Two recently published studies involving researchers at the Weizmann Institute of Science highlight how AFSEM can be used to investigate crystal growth and surface morphology at the nanoscale.
Combining SEM and AFM
Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) provide complementary information about a sample.
SEM allows researchers to locate and identify specific structures and regions of interest, while AFM provides three-dimensional information about surface topography, including height variations and surface roughness.
By integrating the two techniques into a single instrument, AFSEM allows researchers to identify a specific area using SEM and then perform AFM measurements on the selected surface. This makes it possible to correlate structural information with detailed three-dimensional surface measurements.
The two recent studies from the Weizmann Institute demonstrate this approach in two very different research contexts.
Investigating the growth of MOF crystals
The first study focuses on a nickel-based metal–organic framework (MOF) with an unusual multidomain appearance.
The researchers observed particles attaching to the surfaces of growing MOF crystals. These particles subsequently crystallise at the interface and merge with the growing crystal. The study found that particle attachment varies across different regions of the crystal, contributing to differences in growth and to its distinctive morphology.
AFSEM imaging provided information about the three-dimensional morphology of the crystal surfaces, helping the researchers examine the relationship between particle attachment, surface structure and crystal growth.
Characterising coccolith surfaces
The second study focuses on coccoliths, intricate calcium carbonate structures produced by marine microalgae.
The researchers used SEM to locate individual coccoliths and identify different types of crystal surfaces, before using the integrated AFM to investigate their local topography in greater detail.
The SEM images revealed two main types of surfaces: relatively flat and smooth regions, and curved and rougher regions. AFM measurements then provided quantitative information about the differences between these surfaces.
The results showed that the crystallographic surfaces were generally smoother than the curved surfaces, with measurable differences in surface roughness between specific regions of the coccoliths. These observations support the idea that different areas of the coccolith develop under distinct growth conditions.
Two studies, one correlative approach
Although the two studies investigate very different materials, they illustrate the same principle: combining SEM imaging with AFM surface measurements can provide complementary information about complex structures.
From the growth of synthetic MOF crystals to the characterisation of biogenic calcite structures, AFSEM can help researchers locate specific features and investigate their three-dimensional surface morphology at the nanoscale.
Contact our expert Stefano Pergolini to have further information.
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