Identification of the composition of soils and rocks using high-resolution ATLAS micro-XRF system

Rapid elemental analyses from sodium through uranium at trace levels can be accomplished through X-Ray Fluorescence (XRF) instrumentation without destruction, digestion, or alteration of the sample. The innovative benchtop micro-XRF ATLAS system by iXRF Systems is ideally suited for the analysis of inorganic species and offers excellent sensitivity to trace elements (concentrations of less than 100 ppm can be detected, depending on the element and sample matrix). No sample preparation is needed: highly polished samples are not required, and even rough samples can be analyzed with excellent results.

For example, micro-XRF chemical analysis is a front-line tool in the study of volcanoes and volcanic hazards. The analysis of a volcanic rock provides a fundamental common ground for comparing the styles and violence of previous eruptions of similar composition. The micro-XRF technique is then helpful in the determination of certain important elements that occur in coal ash.

The ATLAS system can detect with high resolution 11 elements that are important in a coal ash sample, including: P, Cl, Na, Mg, Al, Si, P, S, K, Ca, Ti, Mn, and Fe. Phase and compositional mapping are powerful tools utilized on the ATLAS micro-XRF platform. Using these tools, a differentiation among varying levels of elements or compounds present in the sample can be performed.

X-ray fluorescence spectrum of the elements included inside the coal ash sample

Compositions maps can also be defined by the user. Multiple ranges of concentrations for each element (or even compounds) can be set versus just one range. For example, the image on the left shows three distinct concentrations of Aluminum in Aluminum Silicate.

Typical XRF mapping softwares force the operator to display only one concentration at a time in an overlay. The ATLAS software enables the operator to define unlimited sets of ranges for elements and compounds in a single custom display.

Compositional aluminum map of the sample

 

 Click here for more information on the Benchtop Micro-XRF Spectrometer Systems >>

Contact

Quantum Design AG

Route du Roule 41
CH-1723 Marly
Switzerland

Phone:+41 21 8699-033
E-Mail:suisse@qd-europe.com