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Lightning in situ TEM biasing & heating series

from DENSsolutions

The Lightning in situ TEM biasing & heating series provides real-time information about your specimen under a controllable electrical and thermal environment.

Features

Simultaneous in situ biasing & heating (6/8 contacts)
FIB preparation and final thinning on MEMS chip
Same heating speed & stability of the Wildfire range
Current measurements in the pA range
Electrical field strengths up to 400kV/cm

Further information

All DENSsolutions systems use patented Nano-Chip MEMS technology

Nano-Chips are state-of-the-art functional sample carriers that replace traditional TEM Cu grids. Based on Micro-Electro-Mechanical Systems (MEMS), they offer the unique ability to expand your application space and control the environment and stimuli locally on the Nano-Chip. Each Nano-Chip creates a micro-scale laboratory environment within your TEM. Due to its very low mass and minimal power consumption, the response times are extremely fast and performance highly reliable.

Unique MEMS design for optimal stability

Nano-Chips are fabricated to ensure a stable, chemically inert and electrically insulated environment.

Heat at the source

Localizing the heating to the same scale dimensions of your sample, ensures the greatest control, offers homogeneous temperature and maximizes the temperature reliability.

Controllable response

The softwareThe software “Impulse” by DENSsolutions is easy-to-use and offers for operational modes, custom profiling, real time temperature output and complete data logging., custom profiling, real time temperature output and complete data logging.

Reliable output

Robust localized closed-loop temperature feedback offers the ultimate in sample stability, temperature response time & accuracy.

Long life-time

> 90 hours at elevated temperatures without affecting your TEM performance.

Application specific fabrication

A range of Nano-Chip support film options to suit all application requirements.

Applications

Electrical properties of nanoscale material and microstructures

Material defect populations and electrical responses

Electromigration studies

Operating MEMs based mechanical testing devices

In-situ testing of solid-state energy devices

Downloads

Lightning brochure

Impulse software

Videos

DENSsolutions - FIB Lamella Preparation - with comments

Reference customers

"In-situ TEM provides a new dimension in dynamic structural studies of a range of technologically important materials. The Department of Materials at Oxford will use the DENSsolutions sample heating holder in a number of projects related to catalysis and low dimensional carbon materials. We have chosen this solution for its unrivaled stability and control."

- Professor Angus Kirkland, Professor of Materials, University of Oxford, United Kingdom