The Zygo portable profiler – Key features

  • Measures both smooth and rough optics
  • Can measure step heights and diffractive surfaces up to 80μm
  • Uses ZYGO proprietary SureScan acquisition technology to enable low uncertainty metrology in the presence of vibration
  • The asymmetric design enables metrology near the outside edge of a large optic
  • Integrated focus aid simplifies alignment
  • Can use large range of standard ZYGO microscope objectives From 2.75x to 100x
  • Operates on Zygo’s new Mx metrology software

The ZYGO portable profiler offers a more complete solution for the measurement of large optics.

Contact

Quantum Design

Krivoklatska 37
199 00 Praha 9
Czech Republic

Phone:+420 607 014 278
E-mail:czechia@qd-europe.com