Our partner Woollam

Economic high precision table top ellipsometer Alpha-SE

From Woollam Co.

Spectroscopic ellipsometer Alpha-SE is a fast, low-cost system for measuring film thickness and optical constants. Everything is contained in an amazingly small package. It is the ideal table top tool. It is computer controlled through an USB port.

  • Ex-situ
  • Rotating compensator ellipsometer
  • Small and compact
  • Affordable
  • Semi-automated

Further information

For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds.


Spectral range: 380 nm to 900 nm (180 wavelengths)

Angle of incidence: 65°, 70° and 75°, as well as straight-through

Computer connection: USB (1.1 or higher) Automated sample height adjustment

Data acquisition time:

  • 3 sec. (Fast mode)
  • 10 sec. (Standard mode)
  • 30 sec. (Long mode)


  • liquid cell
  • adapter for QCM-D
  • focusing
  • transmission holder
  • translation stage
  • camera


Optical constants and thickness, anisotropy, index gradient, composition The Alpha-SE is a very accurate and easy-to-use system to determine optical constants, thickness, index gradient, composition, etc.
Dielectric films With fast measurement speed and push-button operation, the Alpha-SE is ideal for qualifying thin films. Single-layer dielectrics on silicon or glass substrates can be measured in seconds. Log results for easy-to-use comparisons in both graphical and tabular formats.
Self-assembled monolayers Phase information of a spectroscopic ellipsometry measurement is highly sensitive to very thin films (<10 nm). Self-assembled monolayers can be assessed and quickly compared using the Alpha-SE.
Absorbing films Coating on glass


Spectroscopic ellipsometers product overview
About Woollam Co.
Alpha-SE brochure


Introduction to the alpha-SE Spectroscopic Ellipsometer


Richard Schuster
Sales Manager
+420 420 601123-593
Write e-mail
Richard Schuster

Related products

Fast spectroscopic ellipsometer M-2000
The M-2000 ellipsometer combines highly accurate 'rotating compensator' method with fast CCD technology. This allows high speed measurements: min. 390 wavelengths in < 1 second. It is available as ...
Dual rotating compensator ellipsometer RC2
The RC2 is the first spectroscopic ellipsometer with two rotating compensators. It combines the best features of previous instruments with innovative new technology: dual rotating compensator, ...
Widest spectral range ellipsometer VASE
The VASE is our most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers and more.
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) ...
FTIR ellipsometer IR-VASE
The IR-VASE is the first and only spectroscopic ellipsometer to cover the spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). The IR-VASE can determine both n and k for materials over the ...
Ellipsometer for texture Si solar cells T-Solar
T-Solar, a special intensity optimized M-2000, addresses the measurement requirements on textures Si wafer surfaces.
In-situ spectroscopic ellipsometer iSE
The iSE is a new in-situ spectroscopic ellipsometer developed for real-time monitoring of thin film processing.  Using our proven technology, the iSE enables users to optimize optical properties of ...


Quantum Design

Krivoklatska 37
199 00 Praha 9
Czech Republic

Phone:+420 607 014 278
Richard SchusterSales Manager
+420 420 601123-593
Write e-mail