14. June 2022
- 15. June 2022
Halle, Germany / Booth 15
9th CAM-Workshop
Innovation in Failure Analyses and Material Diagnostics of Electronics ComponentsWe will present the correlative AFM and SEM system - the AFSEM.
Dr.
Andreas
Bergner
Product Manager - Electron microscopy & nanotechnology
| +49 6157 80710-12 | |
| +49 6157 80710912 | |
| Write e-mail |
Dr.
Andreas
Bergner
Dr.
Chris
Schwalb
