Standalone AFM (SA-AFM)
For large samples and industryThe SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete AFM system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
- Flexible, stand alone design
- Scans any sample size
- Adaptable to inverted microscopes
- Linearized XY piezoelectric scanner
- Accommodates widest range of standard AFM probes
Further information
Use the SA-AFM System for scanning life science samples, large samples, routine scanning of technical samples, or for nanotechnology research. The SA-AFM is affordable and complete Atomic Force Microscopy system and includes everything required for scanning all sizes and shapes of samples. It is easily integrated nanoscience instrument with all manufacturer's inverted microscopes.
Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.
Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.
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Quantum Design S.A.R.L.
Avenue de l’Atlantique
Bâtiment Fuji Yama
91940 Les Ulis
France
| Phone: | +33 1 69 19 49 49 |
| E-mail: | franceqd-europe.com |
