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Economic high precision table top ellipsometer alpha 2.0

From Woollam Co.

Spectroscopic ellipsometer alpha 2.0 is a fast, low-cost system for measuring film thickness and optical constants. Everything is contained in an amazingly small package. It is the ideal table top tool. It is computer controlled through an USB port.

Features

Ex-situ
Rotating compensator ellipsometer
Small and compact
Affordable
Semi-automated

Further information

For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds.

Specifications

Spectral range: 400 nm to 1000 nm (190 wavelengths)

Angle of incidence: 65°, 70° and 75° and transmission (manual)

Computer connection: USB

Automated sample height adjustment

Data acquisition time: 5 - 10 seconds

Applications

Optical constants and thickness, anisotropy, index gradient, composition The Alpha-SE is a very accurate and easy-to-use system to determine optical constants, thickness, index gradient, composition, etc.

Dielectric films With fast measurement speed and push-button operation, the Alpha-SE is ideal for qualifying thin films. Single-layer dielectrics on silicon or glass substrates can be measured in seconds. Log results for easy-to-use comparisons in both graphical and tabular formats.

Self-assembled monolayers Phase information of a spectroscopic ellipsometry measurement is highly sensitive to very thin films (<10 nm). Self-assembled monolayers can be assessed and quickly compared using the Alpha-SE.

Absorbing films Coating on glass

Downloads

Spectroscopic ellipsometers overview

alpha 2.0 specification

alpha 2.0 brochure

About Woollam Co.

Videos

Contact

Ing. Alessandro Baratti

Product Manager

	+39 06 5004204
	+39 06 5010389
	Write e-mail

Ing. Alessandro Baratti

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Phone:	+39 06 5004204
Fax:	+39 06 5010389
E-mail:	italy@qd-europe.com