Economic high precision table top ellipsometer alpha 2.0

Optical constants and thickness, anisotropy, index gradient, composition The Alpha-SE is a very accurate and easy-to-use system to determine optical constants, thickness, index gradient, composition, etc.

Dielectric films With fast measurement speed and push-button operation, the Alpha-SE is ideal for qualifying thin films. Single-layer dielectrics on silicon or glass substrates can be measured in seconds. Log results for easy-to-use comparisons in both graphical and tabular formats.

Self-assembled monolayers Phase information of a spectroscopic ellipsometry measurement is highly sensitive to very thin films (<10 nm). Self-assembled monolayers can be assessed and quickly compared using the Alpha-SE.

Absorbing films Coating on glass