Ellipsometer for texture Si solar cells T-Solar
From Woollam for textured Si solar cellsT-Solar, a special intensity optimized M-2000, addresses the measurement requirements on textures Si wafer surfaces.
- SiN thickness of texture Si wafers
- Rotating compensator ellipsometer
- High intensity
Further information
The T-Solar ellipsometer combines the best photovoltaic measurement technology into a single system designed specifically for textured samples. Based on the established
M-2000 rotating compensator spectroscopic ellipsometer, the T-Solar measures hundreds of wavelength across the UV-Visible-NIR. To improve performance on rough, textured surfaces that significantly reduce reflected signal, the T-Solar combines a special high-intensity lamp source with our new Intensity-Optimizer*. The T-Solar is perfect for characterizing AR coatings on etched silicon surfaces. In addition, the T-Solar features an adjustable tilt-rotation-stage*, which is required to align the pyramid structures of alkaline-etched monocrystalline surfaces.
*patent pending
Specifications
- Spectral range 245 to 1000 nm (470 wavelengths)
- Automated filter wheel to optimize signal on any sample
- Custom sample stage with variable tilt (0-58°) and rotation (100° range) to allow optimized measurements of textured monocrystaline silicon "pyramid" sufaces
- Detachable focusing probes
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Quantum Design
Krivoklatska 37
199 00 Praha 9
Czech Republic
| Phone: | +420 607 014 278 |
| E-mail: | czechiaqd-europe.com |
