Nanoscale surface characterization system
Alpha300 A from WITecThe WITec atomic force microscope (AFM) alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope which provides superior optical access, easy cantilever alignment and high-resolution sample survey.
- Surface characterization on the nanometer scale
- Nondestructive analysis
- Minimal, if any, sample preparation
- Ease of use in air and liquids
- Precise TrueScan controlled scan stage with a range of 100 µm x 100 µm x 20 µm
Further information
WITec atomic force microscopes (AFMs) are developed and designed to allow combination with other imaging techniques such as confocal Raman imaging. All imaging techniques can be integrated within the same microscope system. By simply rotating the microscope turret the user can then switch between the different methods. Possible combinations with AFM include luminescence, fluorescence, polarization analysis, bright field, dark field, SNOM, and Raman imaging.
The alpha300A offers the following extensions:
- Automated multi-area measurements (incl. auto approach)
- Automated motorized sample positioner in x-, y-, and z-direction, 25 mm travel range
- alpha300 A+ for automated measurements
- alpha500 A for automated large sample investigations
- Motorized scan stage for large-area measurements (150 x 100 mm) with automated sample positioner in x-, y-, and z-direction
- Motorized z-stage system for automated approach
- Automated multi-area and multi-point measurements
- Autofocus
Specifications
Operation Modes:
- Contact Mode
- AC Mode (Tapping Mode)
- Digital Pulsed Force Mode (DPFM)
- Lift Mode
- Magnetic Force Microscopy (MFM)
- Electric Force Microscopy (EFM)
- Phase Imaging
- Force Distance Curves
- Nano-Manipulation/Lithography
- Lateral Force Microscopy (LFM)
- Chemical Force Microscopy (CFM)
- Current Sensing Mode
- Microscope Features:
- Research grade optical microscope with 6 x objective turret
- Video system: eyepiece color video camera
- LED white-light source for Köhler illumination of tip and sample
- High sensitivity b/w video camera to view sample and AFM tip in transmission
- Manual sample positioning in x- and y-direction, 25 mm travel
- Microscope base with active vibration isolation system
- Piezo-driven scan stage (scan range 100 x 100 x 20 µm; others optional)
AFM Cantilever:
- Inertial drive cantilever mechanics for AFM sensors
- Most commercially available AFM cantilever can be used
Sensors:
- AFM sensors, Acoustic AC mode type, with reflex coating, pre-mounted on magnetic rings
- AFM sensors, contact mode type, with reflex coating, pre-mounted on magnetic rings
- Most commercially available sensors can be used
Sample Size:
- Usually 120 mm in x- and y-direction, 25 mm in height (adapter for larger heights available)
Computer Interface:
- WITec software for instrument and measurement control, data evaluation and processing
Applications
Downloads
Contact
Navigation
Categories
Contact
Quantum Design GmbH
Meerstraat 177
B-1852 Grimbergen
Belgium
Mobil: | +32 495 797175 |
E-mail: | beneluxqd-europe.com |