19. September 2022
- 23. September 2022
Leuven, Belgium
MNE 2022
We will present our Correlative AFM and SEM system:
The AFSEM system from GETec enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market and can easily be added to your system.
Chris
Schwalb