Our partner

Desktop Scanning Electron Microscope for Imaging and Elemental Analysis – NANOS

NANOS by Semplor

The NANOS by Semplor is a compact desktop scanning electron microscope for high-resolution imaging, material contrast and optionally integrated EDS analysis. Secondary and backscattered electron detectors provide detailed information on surface topography and material composition. The system combines a compact footprint with flexible sample handling, high- and low-vacuum operation and a motorized XY sample stage.

Features

SEM resolution < 8 nm and magnification from 100x to 200,000x
Everhart-Thornley secondary electron detector and four-quadrant BSE detector for topography and material contrast
Available with or without EDS; fully integrated 30 mm² silicon drift detector in the EDS configuration
High vacuum and low vacuum at 40 Pa for conductive and non-conductive samples
Motorized XY sample stage and eucentric tilt from +15° to -40°
User-replaceable tungsten filament

Further information

Surface Topography and Material Contrast

The Everhart-Thornley secondary electron detector reveals fine surface structures with high detail. The four-quadrant backscattered electron detector visualizes differences in average atomic number and provides material contrast. Its individually addressable segments also enable directional topographic imaging. SE and BSE signals can be overlaid or displayed side by side, allowing direct comparison of topography and composition.

BSE image: differences in material composition

SE image: surface topography

EDS Analysis with an Integrated Silicon Drift Detector

The NANOS can be configured with or without EDS. In the EDS configuration, a thermoelectrically cooled silicon drift detector is fully integrated into the system. The active area is 30 mm², with an energy resolution of < 132 eV at Mn Kα. Elements from boron to americium can be investigated using point analysis, line analysis and spatially resolved elemental mapping.

Discover EDS is available as an optional software module for data evaluation. It combines SEM imaging and EDS analysis in a single interface. Live spectra and live mapping provide visual feedback during acquisition. Automatic peak identification, background correction, peak deconvolution and standardless quantification support data analysis. Measurement data, acquisition parameters and sample positions remain stored within the project for subsequent analysis and documentation.

Discover EDS combines SEM imaging, spectrum and spatially resolved elemental maps.

Sample Navigation, Sample Stage and Vacuum

An adaptive color camera captures an optical overview of the sample surface after loading. Regions of interest can therefore be located quickly and approached directly.

The motorized XY stage provides a travel range of 25 x 25 mm. Eucentric tilting keeps the selected sample region in focus while the sample is tilted, and the tilt angle is displayed in the user interface.

The NANOS operates in high vacuum for high-resolution imaging and in low vacuum at 40 Pa. Low-vacuum operation reduces charging effects on non-conductive samples and can reduce sample preparation requirements. Samples up to 45 mm in diameter and 19 mm in height can be accommodated; sample heights of up to 40 mm are available as an option. The available tilt range is reduced when using the maximum sample diameter.

Eucentric tilting keeps the selected sample region in focus.

Easily accessible NANOS sample chamber.

Optional sample holder for samples up to 40 mm in height.

Optional Software Modules for Particle, Fiber and 3D Analysis

The Explore modules integrated into the user interface extend SEM imaging with quantitative analysis capabilities:

Explore Particles detects, segments and measures particles, pores and grains and provides size distributions and shape parameters.
Explore Fibers determines fiber length, diameter, orientation and curvature and supports batch processing of larger datasets.
Explore 3D generates 3D reconstructions, height maps and surface roughness statistics from SEM images.

Explore Particles

Explore 3D

Explore Fibers

Designed for High Availability and Low Operating Costs

The NANOS does not require a cleanroom or specialized laboratory infrastructure. With dimensions of 280 x 470 x 550 mm and a weight of 62 kg, the system can also be installed in laboratories where space is limited.

The tungsten filament is designed to be replaced by the user, allowing routine maintenance to be carried out without extensive intervention in the system.

Replacing the tungsten filament on the NANOS.

Applications

The NANOS supports imaging, analytical and quantitative tasks in research, development and quality control.

Materials and microstructure analysis: Microstructures, phases, pores, inclusions, fracture surfaces and local elemental distributions in metals, ceramics, minerals and composite materials.

Surfaces, coatings and interfaces: Topography, coating morphology, corrosion, wear, interfaces and defects on functional and technical surfaces.

Particle, pore and powder analysis: Morphology, size, shape and distribution of particles, pores and grains; quantitative analysis with Explore Particles.

Fiber and environmental analysis: Characterization of fibers, microplastics, fine particles and contaminants; quantitative fiber analysis with Explore Fibers.

Failure analysis and quality control: Fractures, foreign particles, residues, technical cleanliness and production-related deviations.

Biological, medical and pharmaceutical samples: Biological structures, biomaterials, implant surfaces as well as active ingredients, excipients and foreign materials, depending on sample preparation and vacuum compatibility.

Specifications

Electron Optics and Imaging

SEM Resolution	< 8 nm
Magnification	100x to 200,000x
Image Resolution	up to 4096 x 4096 pixels
Accelerating Voltages	1, 2, 5, 7, 10, 15 and 20 kV
Electron Source	thermionic tungsten source
Imaging Detectors	Everhart-Thornley SED; four-quadrant BSE detector

EDS – Depending on Configuration

Detector	thermoelectrically cooled silicon drift detector
Active Area	30 mm²
Energy Resolution	< 132 eV at Mn Kα
Maximum Count Rate	300,000 cps
Detectable Elements	boron (B, 5) to americium (Am, 95)
Analysis Modes	point analysis, line analysis and elemental mapping
Mapping Resolution	up to 2048 x 2048 pixels

Vacuum and Sample Stage

Vacuum	high vacuum; low vacuum at 40 Pa
XY Travel	motorized, 25 x 25 mm
Tilt	manual, eucentric; +15° to -40°
Sample Diameter	up to 45 mm
Sample Height	up to 19 mm; optional up to 40 mm

System Data

Dimensions	280 (W) x 470 (D) x 550 (H) mm
Weight	62 kg
Environmental Conditions	15-25 °C; 20-80% relative humidity
Power Consumption	typically 110 W; maximum 140 W