Materials science and spectroscopic measurements
We offer special measurement services for materials science and spectroscopy to you at our premises. You are welcome to use our state-of-the-art application lab for your measurements or benefit from the many years of experience we have in the above fields and let us do the measurements for you.
We offer the following measurements:
- Thickness measurements of transparent and semi-transparent thin films
- Optical constants of bulk samples and thin film systems by spectroscopic ellipsometry
- Particle sizing
- Molecular interactions on surfaces
- Viscoelastic properties of thin films
Available measurement systems and contacts:
Dr.
Raimund
Sauter
- QCM-D: Q-Sense Analyzer and Explorer
Thomas
Wagner
Product Manager - Ellipsometry & Surface Science
| +49 6157 80710-68 | |
| +49 6157 80710968 | |
| Write e-mail |
Thomas
Wagner
- Spectroscopic ellipsometry: J. A. Woollam RC2, VASE, Alpha-SE
Stefan
Wittmer
Product Manager - Imaging & Materials Science & Spectroscopy
| +49 6157 80710-63 | |
| +49 6157 80710963 | |
| Write e-mail |
Stefan
Wittmer
- Particle size analyser: Disc centrifuge CPS DC24000 UHR
