FTIR ellipsometer IR-VASE

From Woollam Co.

The IR-VASE is the first and only spectroscopic ellipsometer to cover the spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). The IR-VASE can determine both n and k for materials over the entire width of the spectral range without extrapolating data outside the measured range, as with a Kramers-Kronig analysis. Like other Woollam ellipsometers, the IR-VASE is perfect for thin films or bulk materials including dielectrics, semiconductors, polymers and metals.

Features
  • Rotating compensator ellipsometer
  • Widest spectral range
  • Vertical sample mount
  • Combination of ellipsometry and transmittance

Further information

Non-destructive characterization

The IR-VASE offers non-contact measurements of many different material properties including thickness, optical constants, material composition, chemical bonding, doping concentration, and more. Measurements do not require vacuum and can be used to study liquid/solid interfaces common in biology and chemistry applications.

No baseline or reference sample required

Ellipsometry is a modulation technique that does not require scans or reference samples to maintain accuracy. Even samples that are smaller than the beam diameter can be measured because the entire beam does not need to be collected.

Highly accurate measurement

Patented calibration and data acquisition procedures remove effects of imperfect optical elements to provide accurate measurements of Ψ and Δ.

Specifications

  • Spectral range: 1.7 µm to 30 µm (further with good reflective samples)
  • Verticale sample mount
  • Motorized angle of incidence goniometer: 32° to 90°
  • Ellipsometry, transmittance and reflectance, Mueller matrix, generalized ellipsometry, depolarisation

Applications

Epitaxial layers and doping concentration and doping profiles At infrared wavelengths, the difference in free-carrier levels can cause optical contrast between epitaxial or implanted layers. This gives IR-VASE excellent sensitivity to epitaxial layer thickness and substrate doping concentration. The ellipsometer also has good sensitivity to carrier gradients at interfaces. Carrier profiles show near-perfect in agreement when nondestructive IR-VASE and destructive SIMS measurements are compared.
Phonon structure (compound semiconductors) The wide spectral range IR-VASE is important for phonon absorption studies. Data on the left show phonon modes of a GaN / AlGaN laser structure, modeled to determine alloy ratios, doping concentrations, and film quality.
Molecular bond vibrations Like standard FTIR spectroscopy, IR ellipsometry relies on the information about molecular bond vibrations. Infrared absorption caused by these vibrations can be studied in bulk or thin film materials. IR ellipsometry offers increased sensitivity over FTIR spectroscopy. It also presents the advantage of obtaining both n and k rather than just absorbance values. Figures below show measured optical constants of a silicone thin film with vibrational absorptions labeled.
Optical coatings
Multilayer characterization

Downloads

Spectroscopic ellipsometers product overview
IR-VASE Mark II brochure

Contact

Gauthier Caby
Gauthier Caby

Related products

In-situ spectroscopic ellipsometer iSE
The iSE is a new in-situ spectroscopic ellipsometer developed for real-time monitoring of thin film processing.  Using our proven technology, the iSE enables users to optimize optical properties of ...
Fast spectroscopic ellipsometer M-2000
The M-2000 ellipsometer combines highly accurate 'rotating compensator' method with fast CCD technology. This allows high speed measurements: min. 390 wavelengths in < 1 second. It is available as ...
Dual rotating compensator ellipsometer RC2
The RC2 is the first spectroscopic ellipsometer with two rotating compensators. It combines the best features of previous instruments with innovative new technology: dual rotating compensator, ...
Economic high precision table top ellipsometer alpha 2.0
Spectroscopic ellipsometer alpha 2.0 is a fast, low-cost system for measuring film thickness and optical constants. Everything is contained in an amazingly small package. It is the ideal table top ...
Widest spectral range ellipsometer VASE
The VASE is our most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers and more.
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) ...
Ellipsometer for texture Si solar cells T-Solar
T-Solar, a special intensity optimized M-2000, addresses the measurement requirements on textures Si wafer surfaces.

Contact

Quantum Design S.A.R.L.

Avenue de l’Atlantique
Bâtiment Fuji Yama
91940 Les Ulis
France

Phone:+33 1 69 19 49 49
E-mail:franceqd-europe.com
Gauthier CabyProduct Manager
01 69 19 49 49
Write e-mail