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Nano-Profiling AFM (NP-AFM)

For process control and development

The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

Features
  • Nano-Profiling AFM
  • Standard Operating Modes
  • Three Sample Stage Options
  • Linearized X, Y Piezoelectric
  • Direct-Drive Tip Approach

Further information

The NP-Atomic Force Microscope is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP-AFM system, and several stage options are available for many types of samples in order to create perfect nanoscience instrument for nano imaging and analysis.

Downloads

Contact

Séverine Dubroecq
Product Manager
06 77 01 01 94
Write e-mail
Séverine Dubroecq

Contact

Quantum Design S.A.R.L.

Avenue de l’Atlantique
Bâtiment Fuji Yama
91940 Les Ulis
France

Phone:+33 1 69 19 49 49
E-mail:franceqd-europe.com
Séverine DubroecqProduct Manager
06 77 01 01 94
Write e-mail