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Nano-Profiling AFM (NP-AFM)
For process control and developmentThe NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
- Nano-Profiling AFM
- Standard Operating Modes
- Three Sample Stage Options
- Linearized X, Y Piezoelectric
- Direct-Drive Tip Approach
Further information
The NP-Atomic Force Microscope is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP-AFM system, and several stage options are available for many types of samples in order to create perfect nanoscience instrument for nano imaging and analysis.
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Contact
Séverine
Dubroecq
