Materials science and spectroscopic measurements

We offer special measurement services for materials science and spectroscopy to you at our premises. You are welcome to use our state-of-the-art application lab for your measurements or benefit from the many years of experience we have in the above fields and let us do the measurements for you.

We offer the following measurements:

  • Thickness measurements of transparent and semi-transparent thin films
  • Optical constants of bulk samples and thin film systems by spectroscopic ellipsometry
  • Particle sizing
  • Molecular interactions on surfaces
  • Viscoelastic properties of thin films

Available measurement systems and contacts:

  • QCM-D: Q-Sense Analyzer and Explorer
  • Spectroscopic ellipsometry: J. A. Woollam RC2, VASE, Alpha-SE
  • Particle size analyser: Disc centrifuge CPS DC24000 UHR

Contact

Quantum Design S.A.R.L.

Avenue de l’Atlantique
Bâtiment Fuji Yama
91940 Les Ulis
France

Tél. :01 69 19 49 49
Email :franceqd-europe.com