Invitation: Correlative In-Situ Analysis by combination of AFM, SEM, and FIB
We cordially invite you to come and discuss with us on 9th July from 12:00 to 14:00 at the Institut Català de Nanociència i Nanotecnologia, Sala Auditori ICN2 in Barcelona.
- Whole wafer imaging
- Quantitative height measurements
- Combined SEM /AFM imaging
- Elasticity coefficient measuring and mapping
- Sub-nanometer resolution on non-conducting samples
More information on https://icn2.cat/en/
