Correlative Microscopy – Raman/AFM/SNOM/SEM
- Magnetism
- Materials science
- 3D Confocal Raman microscopes
- Atomic force microscopes (AFM)
- Correlative Microscopy – Raman/AFM/SNOM/SEM
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Hall effect
- Nanoindenters - Nanohardness tester
- Photo lithography systems
- QCM-D Quartz Crystal Microbalance
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Thermoelectric measurements
- Very-low resistance measurements
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
The AFSEM system enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market ...
The well-established Raman-atomic force microscope (AFM) combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument ...
For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with scanning near-field optical microscopy (SNOM) for optical imaging with ...
The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging ...